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« Previous Abstract[Characteristics of Volatile Organic Compounds Emitted from Biomass-pellets-fired Boilers]    Next AbstractDetermination of volatile organic compounds in workplace air by multisorbent adsorption/thermal desorption-GC/MS »

J Chromatogr A


Title:Measurement of toxic volatile organic compounds in indoor air of semiconductor foundries using multisorbent adsorption/thermal desorption coupled with gas chromatography-mass spectrometry
Author(s):Wu CH; Lin MN; Feng CT; Yang KL; Lo YS; Lo JG;
Address:"Department of Atomic Science, National Tsing Hua University, Hsinchu 300, Taiwan"
Journal Title:J Chromatogr A
Year:2003
Volume:996
Issue:1-Feb
Page Number:225 - 231
DOI: 10.1016/s0021-9673(03)00544-2
ISSN/ISBN:0021-9673 (Print) 0021-9673 (Linking)
Abstract:"A method for the qualitative and quantitative analysis of volatile organic compounds (VOCs) in the air of class-100 clean rooms at semiconductor fabrication facilities was developed. Air samples from two semiconductor factories were collected each hour on multisorbent tubes (including Carbopack B, Carbopack C, and Carbosieve SIII) with a 24-h automatic active sampling system and analyzed using adsorption/thermal desorption coupled with gas chromatography-mass spectrometry. Experimental parameters, including thermal desorption temperature, desorption time, and cryofocusing temperature, were optimized. The average recoveries and the method detection limits for the target compounds were in the range 94-101% and 0.31-0.89 ppb, respectively, under the conditions of a 1 L sampling volume and 80% relative humidity. VOCs such as acetone, isopropyl alcohol, 2-heptanone, and toluene, which are commonly used in the semiconductor and electronics industries, were detected and accurately quantified with the established method. Temporal variations of the analyte concentrations observed were attributed to the improper use of organic solvents during operation"
Keywords:"2-Propanol/analysis Acetone/analysis Adsorption Air Pollutants, Occupational/*analysis Gas Chromatography-Mass Spectrometry/*methods Hot Temperature *Industry Ketones/analysis Organic Chemicals/*analysis *Semiconductors Sensitivity and Specificity Solvent;"
Notes:"MedlineWu, Chien-Hou Lin, Ming-Nan Feng, Chien-Tai Yang, Kuang-Ling Lo, Yu-Shiu Lo, Jiunn-Guang eng Research Support, Non-U.S. Gov't Netherlands 2003/07/02 J Chromatogr A. 2003 May 9; 996(1-2):225-31. doi: 10.1016/s0021-9673(03)00544-2"

 
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