Title: | Prediction of initial emission rates of 2-butoxyethanol from consumer products using equilibrium headspace concentrations: an application of the vapor pressure and boundary layer (VB) model |
Author(s): | Zhu J; Li H; Korchinski M; Fellin P; |
Address: | "Chemistry Research Division, Health Canada, Tunney's Pasture, Ottawa, Ontario, K1A 0L2, Canada. jiping_zhu@hc-sc.gc.ca" |
ISSN/ISBN: | 0013-936X (Print) 0013-936X (Linking) |
Abstract: | "The initial emission rate of volatile organic compounds (VOCs) from consumer products is important for assessing potential human exposure to VOCs in products. The vapor pressure and boundary layer (VB) model developed in the past was used to predict the emission rates of VOCs in the fast decaying phase from petroleum-based wet materials. This study has extended the model to largely water-based products. Study results have shown a good agreement (ratio = 1.01, r2 = 0.89) between model-predicted initial emission rates (ER0) of 2-butoxyethanol (2-BE) based on its equilibrium headspace concentration and experimentally measured ER0 in a small dynamic environmental chamber for 20 consumer products. These water-based products included wood surface treating stains, general cleaning agents, and degreasers with 2-BE concentrations over a wide range. The results also demonstrated a dependency between the headspace concentrations of the target analytes and the water content in the liquid. But dependency on water content had no effect on the use of headspace concentration to predict the ER0. The ER0 of 2-BE in the products ranged from 100 to 3000 mg m(-2) h(-1). In the majority of cases, the 2-BE concentration range in individual products indicated in the Material Safety Data Sheet agreed with the measured data" |
Keywords: | Environmental Pollutants/*analysis Ethylene Glycols/*analysis Gas Chromatography-Mass Spectrometry Quality Control Volatilization; |
Notes: | "MedlineZhu, Jiping Li, Henrik Korchinski, Mark Fellin, Phil eng Research Support, Non-U.S. Gov't 2005/11/22 Environ Sci Technol. 2005 Nov 1; 39(21):8214-9. doi: 10.1021/es051080f" |